Items where Author is "Lee, L."

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Yahya, E.A. and Kannan, R. and Lee, L. (2019) Simulation study of single event effects sensitivity on commercial power MOSFET with single heavy ion radiation. Bulletin of Electrical Engineering and Informatics, 8 (4). pp. 1260-1267.

This list was generated on Tue Dec 3 01:29:36 2024 +08.