Items where Author is "Reaz, B. I."

Lo, Hai Hiung and Lee, Weng Fook and Reaz, B. I. and Hamid, Nor Hisham (2009) Design Methodology to Achieve Good Testability of VLSI Chips: An Industrial Perspective. In: International Conference on Electronic Design (ICED 2008), 1~3 December, 2008, Park Royal Hotel, Penang, Malaysia.